Microelectronic Engineering Conference 1988
Papers
16 x 1 nMOS Static Random Access Memory Design
David W. Dougherty
Radiation Effects on PMOS Devices
Camille G. Bates
Boron Solid Source Characterization
Kelly Baycura
CMOS PLA Layout Generation
Christopher D. Bryant
Multilevel Metallization at RIT
Manuel N. Carneiro
Automated Design Rule Checking
Carl E. Conrad
Response Surface Methodology Using Experimental Design
Jamshed H. Dubash
Development and Evaluation of Chlorinated Gate Oxides
David H. Fatke
CMOSFET Devices - Design, Fabrication and Testing
Robert J. Forness
Characterization of the Perkin-elmer Model 140 Projection Aligner Exposure Source and Modeling of Resist Profiles
Arthur Shaun Francomacaro
Fabrication of a Single Level Metal CCD Shift Register
John P. Gardner
Software Analysis of Capacitance-Voltage Measurements
Richard A. German
Thickness Measurements Using Prism Coupling
Daniel J. Hahn
Advanced Mask Making at RIT
David P. Kanen
A Design Tool Software Interface
Thomas C. Kucmierz
An Integrated Approach to Positive Resist Development Characterization
Mozafar Maghsoudnia
Time Dependence of Hot Electron Induced Surface States
Joseph P. Magliocco
HIAC/ROYCO Particle Counter Installation
Scott H. McCracken
Redesign of an Eight-Bit, ECL DAC to Facilitate Speed and Functionality Testing of a BI-CMOS Process
William A. McGee
Evaluation of Plasma Damage to Thin Gate Oxides
Patricia A. Ostling
WEDAX Studies on the Hitachi S.E.M.
Ronald L. Quiett Jr
Evaluation of Integrated Injection Logic Devices at RIT
Carl J. Romano
Hall Measurements in Semiconductors
Tony Scelsi
Superconductor Test Station
William F. Schofield II
The Use of a Contrast Enhancement Layer to Extend the Practical Resolution Limits of Optical Lithographic Systems
Daniel R. Sutton
PMOS Operational Amplifier
Khanh-Binh Ta