Publication Date
1988
Document Type
Paper
Abstract
A basic test station, using a modified four point probe was designed and built for measuring resistivity over a temperature range. This test station can now be used to characterize the effects of any subsequent semiconductor processing on transition temperatures and performance of superconductive films.
Recommended Citation
Schofield, William F. II
(1988)
"Superconductor Test Station,"
Journal of the Microelectronic Engineering Conference: Vol. 2:
Iss.
1, Article 30.
Available at:
https://repository.rit.edu/ritamec/vol2/iss1/30