Publication Date
1990
Document Type
Paper
Abstract
An IBM computer, a HP4145B parametric analyzer, a Micromanipulator 410 capacitance meter, and a Keithley 230 voltage source were networked together to form a test setup to measure the recombination and generation lifetimes of minority carriers. The Zerbst relationships were used to calculate lifetimes. Results indicate that the test setup~has the ability to take accurate data, but when the capacitance-time data was analyzed, the calculated lifetimes were not believable. The problem seems to be the quality of the fabricated capacitors and not the setup.
Recommended Citation
Krawiecki, James
(1990)
"Performing C-T Measurements,"
Journal of the Microelectronic Engineering Conference: Vol. 4:
Iss.
1, Article 25.
Available at:
https://repository.rit.edu/ritamec/vol4/iss1/25