Publication Date
2016
Document Type
Presentation
Recommended Citation
Burbine, Andrew; Fryer, David; Sturtevant, John; and Smith, Bruce W.
(2016)
"Bayesian Analysis for Photolithographers,"
Journal of the Microelectronic Engineering Conference: Vol. 22:
Iss.
1, Article 29.
Available at:
https://repository.rit.edu/ritamec/vol22/iss1/29
