The lifecycle of a system is dependent on the system design. However, the concern with quality has been stressed mostly during its production and use. The understanding of the system variability generated by noise variables shifted the quality focus to the design phase. The development of robustness early on the system lifecycle increases the system reliability through its entire life cycle. Although the robust design approach developed by the Taguchi methods application had a great contribution to this philosophy, there is much criticism of this methodology. One alternative to the Taguchi method is the Operating Window methodology. Its application has successfully been demonstrated as a substitute for the Taguchi methods, especially when the response is not quantitative. However, most of the examples were used repeatedly and the steps on the application of the methodology have not been well detailed. Therefore, this project had the objective of developing a unique application of the methodology with a simple approach. Moreover, with the implementation of the methodology, the project aims to identify the difference between a design with a wide output data distribution and a design with a narrow distribution. The methodology followed the Operating Window methodology steps, applying it to a circuit board printing process. The results have shown that it is possible to have a relationship between the Operating Window range and the distribution variation from the system output.

Library of Congress Subject Headings

Printed circuits; Screen process printing; Product life cycle

Publication Date


Document Type


Student Type


Degree Name

Manufacturing and Mechanical Systems Integration (MS)

Department, Program, or Center

Manufacturing and Mechanical Engineering Technology (CAST)


James Lee

Advisor/Committee Member

Robert Garrick

Advisor/Committee Member

Marcos Esterman


Physical copy available from RIT's Wallace Library at TK7868.P7 P47 2016


RIT – Main Campus