Jason Barrett

Abstract

Thin films are typically designed to transmit or reflect light based upon spectral performance. The films can be designed with very specific wavelength targets. For Applied Coatings’ customers, the wavelengths in question are typically in or around the visible range. Accurate measurements are required for customer satisfaction. An in-process quality check utilizing a scanning monochromator system has been used successfully for several years. The ability to receive support into the new millennium on the generic system that has been in place has driven a new project. The project, called the Scanning Monochromator Measurement System (SaMMS), is key to Applied Coatings, Inc. continued ability to produce both high quality and volume for the many diverse customers’ products. The SaMMS system was originally designed to offer a Graphical User Interface (GUI) interaction between user and machine where there was previously a menu driven text format. The author of the original code was no longer in Applied Coatings, Inc. employ, the hardware that it ran on was no longer going to be supported by the original vendor, and spare parts were not readily available. A completely new measurement system was needed. I have been involved in development, integration, and installation of the SaMMS software; testing and calibration of the photodiode array spectrophotometers purchased; design, alignment, and testing of the light collection stations; and training, documentation, and justification at all levels for the end user.

Publication Date

2002

Document Type

Thesis

Advisor

Not listed.

Comments

Note: imported from RIT’s Digital Media Library running on DSpace to RIT Scholar Works in February 2014. senior project.

Campus

RIT – Main Campus

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