Abstract
The research, presented in this dissertation, consists of two parts. In the first half of the work a novel microscopy method, Frequency-domain Field- confined Scanning Optical Microscopy (FFSOM), capable of a resolution below the classical diffraction limit, is introduced. An experimental verification in the case of fluorescence microscopy is also presented, suggesting the biological microscopy research as an important application field. The second half of the thesis is devoted to an experimental measurement of the subpixel spatial variations in solid-state light detectors, namely in a Charge-Coupled Devices (CCD). A specialized high-resolution scanning optical microscope, is described. With the help of this microscope, the detector's pixel response function is measured with arguably the highest resolution that can be achieved in this type of measurements. The importance of the pixel response function knowledge is demonstrated in the case of photometric measurements in astronomy.
Library of Congress Subject Headings
Microscopy; Charge coupled devices
Publication Date
1997
Document Type
Dissertation
Student Type
Graduate
Department, Program, or Center
Chester F. Carlson Center for Imaging Science (COS)
Advisor
Ninkov, Zoran
Advisor/Committee Member
Boyd, Robert
Advisor/Committee Member
Kotlarchyk, Michael
Recommended Citation
Kavaldjiev, Daniel, "High-resolution microscopy: Application to detector characterization and a new super-resolution technique" (1997). Thesis. Rochester Institute of Technology. Accessed from
https://repository.rit.edu/theses/6498
Campus
RIT – Main Campus
Comments
Note: imported from RIT’s Digital Media Library running on DSpace to RIT Scholar Works. Physical copy available through RIT's The Wallace Library at: QH205.2 .K38 1997