Author

Xiaorong Lin

Abstract

The object of this project is to study the electret properties of silicon dioxide coating. Silicon dioxide coatings were produced by microwave plasma chemical vapor deposition under various conditions such as pressure, flow ratio, power, etc.. DC bias, thermionic emission and corona charge were used to produce charges in the silicon dioxide film. The results include measurements of deposition rate of silicon dioxide, the absorption wavenumbers, the thickness and index of silicon dioxide coating. The electret properties were focused on the charging process, charge distribution and charge decay rate.

Library of Congress Subject Headings

Electrets; Plasma-enhanced chemical vapor deposition; Silica

Publication Date

11-1-1993

Document Type

Thesis

Department, Program, or Center

Electrical Engineering (KGCOE)

Advisor

Ramanan, Sannasi

Comments

Note: imported from RIT’s Digital Media Library running on DSpace to RIT Scholar Works. Physical copy available through RIT's The Wallace Library at: QC585.8.E4 L56 1993

Campus

RIT – Main Campus

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