Abstract
Reliability predictions of electronic equipment are considered highly valuable; yet the most widely used technique, Military Handbook 217 is criticized as inaccurate. The industry response to the Handbook has been to develop a myriad of methodologies for failure rate prediction. This paper uses four (4) reliability prediction methods to forecast the failure rate of two (2) circuit boards for which a field failure history exists. The predicted failure rate for each procedure on each board is compared to the actual failure rate; and a first-order correction factor is calculated.
Library of Congress Subject Headings
Electronic circuits--Reliability
Publication Date
9-1-1991
Document Type
Thesis
Department, Program, or Center
Electrical Engineering (KGCOE)
Advisor
None Provided
Recommended Citation
Butturini, Randal, "A comparison of reliability prediction methodologies to observed field failure data" (1991). Thesis. Rochester Institute of Technology. Accessed from
https://repository.rit.edu/theses/5605
Campus
RIT – Main Campus
Comments
Note: imported from RIT’s Digital Media Library running on DSpace to RIT Scholar Works. Physical copy available through RIT's The Wallace Library at: TK7867 .B87 1991