Abstract
A comparison of the sine-wave and edge gradient MTF measurement methods, on a photographic black and white film, was performed. A statistical test, a CMT acutance test, and a graphical comparison showed that there was no significant difference between the two measurement methods. This was true for the film processed to have large adjacency effects, as well as for the film processed to have no adjacency effects; however, the agreement was slightly better for the latter process. The research also showed that aligning the midpoints of the edge traces, normalizing the individual edge traces, and then averaging several edge traces significantly reduced grain noise, and produced a superior representative edge for MTF analysis. A new adaptive damping filter also proved quite successful in the suppression of grain noise without degrading the MTF measurement. The combination of averaging several edge traces, and then using the adaptive filter, produced excellent MTF results from the edge traces.
Library of Congress Subject Headings
Transfer functions; Photographic emulsions; Photographic optics
Publication Date
7-24-1985
Document Type
Thesis
Department, Program, or Center
School of Photographic Arts and Sciences (CIAS)
Advisor
Granger, Edward
Advisor/Committee Member
Altman, Joseph
Advisor/Committee Member
Doerner, Edward
Recommended Citation
Cadou, John, "Comparison of Two MTF Measurement Methods: Sine-Wave Vs Edge Gradient Analysis" (1985). Thesis. Rochester Institute of Technology. Accessed from
https://repository.rit.edu/theses/5165
Campus
RIT – Main Campus
Comments
Note: imported from RIT’s Digital Media Library running on DSpace to RIT Scholar Works in December 2013.
Physical copy available from RIT's Wallace Library at TR220 .C33 1985