Abstract
This investigation expands on previous photographic studies of the sensitivity of sulfur and sulfur-plus-gold sensitized octahedral AgBr emulsions to long wavelength light. The experimental atmosphere was controlled by a variable temperature vacuum sensitometer which reduced the oxygen and moisture content of emulsion coatings and thereby improved the efficiency of long wavelength sensitivity. The relative sensitivity at long wavelengths was determined as a function of wavelength, sensitizer level, and sensitizer type. The activation energy actually measures the energy for a hole release from an excited sensitizer center and not for an electron release as earlier work has claimed. By correlating the desensitization by 02 with the measured energy levels, a thermal trap depth of electrons trapped at sensitizer centers was derived.
Library of Congress Subject Headings
Photographic emulsions; Photographic sensitometry
Publication Date
8-1-1992
Document Type
Thesis
Advisor
Not listed
Recommended Citation
Zhang, Dan, "Electronic properties of sensitizer centers" (1992). Thesis. Rochester Institute of Technology. Accessed from
https://repository.rit.edu/theses/4459
Campus
RIT – Main Campus
Comments
Note: imported from RIT’s Digital Media Library running on DSpace to RIT Scholar Works in December 2013. Physical copy available through RIT's The Wallace Library at: TR280 .Z42 1992