Abstract

The technique of Scanning Tunneling Optical Resonance Microscopy (STORM) has been investigated for use on nanostructures. It has been demonstrated as a viable technique to characterize both bulk and nanostructured materials by optically pumping the tip-sample junction with variable energy photons thereby changing the electronic signature in the scanning tunneling microscope allowing for the determination of the local absorption spectrum. STORM offers an alternative technique to characterize very small structures that lie beyond the limits of more conventional approaches.

Library of Congress Subject Headings

Scanning tunneling microscopy; Quantum dots; Indium arsenide

Publication Date

6-1-2008

Document Type

Thesis

Department, Program, or Center

Chester F. Carlson Center for Imaging Science (COS)

Advisor

Raffaelle, Ryne

Advisor/Committee Member

Hailstone, Richard

Advisor/Committee Member

Kotlarchyk, Michael

Comments

Note: imported from RIT’s Digital Media Library running on DSpace to RIT Scholar Works. Physical copy available through RIT's The Wallace Library at: QH212.S35B97 2008

Campus

RIT – Main Campus

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