Abstract
Quantum sensitivity is an important emulsion property for photographic image formation and is usually calculated from a fraction of grains developable vs. log exposure (F-log E) curve. In this thesis, a new method, the electrolytic grain-size analyzer (EGSA) technique has been developed that will allow one to obtain F-log E curves for each grain size class in polydisperse emulsions. The correctness of the F-log E curve obtained by this new method has been examined by comparing the F-log E curve with that calculated from the normalized D-log E curve in the case of monodisperse emulsions. The problems in EGSA measurement, such as "noise" and emulsion solubility, which affect the accuracy of F-log E curves obtained by such a method, have been solved and are discussed in detail. The technique has been applied to the case of an emulsion with a bimodal grain size distribution.
Library of Congress Subject Headings
Photographic emulsions; Photographic chemistry; Emulsions; Electrochemical analysis
Publication Date
10-1-1998
Document Type
Thesis
Department, Program, or Center
Chester F. Carlson Center for Imaging Science (COS)
Advisor
Hailstone, Richard
Advisor/Committee Member
Hornak, Joseph
Advisor/Committee Member
DiFrancesco, Gary
Recommended Citation
Wen, Zhenhuan, "Fraction of grains development measured by electrolytic grain size analyzer" (1998). Thesis. Rochester Institute of Technology. Accessed from
https://repository.rit.edu/theses/2880
Campus
RIT – Main Campus
Comments
Note: imported from RIT’s Digital Media Library running on DSpace to RIT Scholar Works. Physical copy available through RIT's The Wallace Library at: TR395 .W46 1998