Abstract
Radio Frequency performance of field-effect transistors has been explored in depth, experimented and industrially in use since a long time. Whenever one thinks of transistors which could take us to the regime of more than 1 THz in frequency it would always be the High Electron Mobility Transistors (HEMTS) as the perfect solution to that. The Graphene transistors have been very much in research from 2010 and promise equal results due to their huge potential in mobility. In the Semiconductor Manufacturing And Fabrication Laboratory at the Rochester Institute Of Technology our research group has been designing, fabricating and characterizing the graphene transistors of top-gated and back- gated varieties of which the former has been more explored and characterized because of its potential in high frequency performance. In this thesis characterization of both the top-gated and the back-gated varieties will be discussed in intricate detail with different permutation and combinations in experiments in order to depict the efficiency of these transistors in terms of their frequency characteristics and the possible ways to optimize the mobility and transconductance, thereby changing the hysteresis behaviours of the top-gated transistors. The maximum oscillation frequency has been explored for the top-gated variant where it can be estimated how they are in performance and exhibit unique nature compared to that of the PMOS and the NMOS devices along with this distinctive hysteresis behaviours by application of a polymer on GFETs has been investigated.
Library of Congress Subject Headings
Field-effect transistors--Materials; Graphene; Radio frequency; Hysteresis; Nonvolatile random-access memory
Publication Date
7-5-2023
Document Type
Thesis
Student Type
Graduate
Degree Name
Electrical Engineering (MS)
Department, Program, or Center
Department of Electrical and Microelectronic Engineering (KGCOE)
Advisor
Ivan Puchades
Advisor/Committee Member
James E. Moon
Advisor/Committee Member
Sean L. Rommel
Recommended Citation
Moitra, Mohit, "RF Device Characterization of Graphene Transistors" (2023). Thesis. Rochester Institute of Technology. Accessed from
https://repository.rit.edu/theses/11551
Campus
RIT – Main Campus
Plan Codes
EEEE-MS