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Publication Date

1991

Document Type

Paper

Abstract

At RIT, a sol-gel method is being used to synthesize lead zirconate titanate (PZT). Techniques available to characterize these films include scanning electron microscopy ellipsometry, energy dispersive analysis using X-rays (EDAX), and X-ray diffraction (XRD) to determine crystallinity. After heating above the Curie temperature, XRD indicated that a perovskite structure, known to be ferroelectric, was obtained for a PZT film.

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