Abstract

The primary interest of this research is to introduce selected environmental effects into RIT’s Digital Imaging and Remote Sensing Image Generation (DIRSIG) Model. DIRSIG is capable of producing high resolution images (meter scale) using Computer Aided Design models (CAD) of buildings, vehicles, trees, etc. across the full optical spectrum (0.35-25μm). Currently, these objects are modeled in a pristine manner and there is no option to simulate them after exposure to environmental effects. Ideally, we would like to subject a given material to these environmental effects and then accurately model the modified reflected or emitted spectrum. As a first step, we have chosen to model moisture and dust on surfaces by implementing a model of the effects of a thin layer of water and soil coverage, respectively, on the spectral reflectance and emittance of different materials. Using new techniques for field instruments in a laboratory setting, we have established the relationship between the surface contaminant and its effect on the target in question. These results will be incorporated into the DIRSIG modeling tool for wider use.

Publication Date

7-2006

Comments

© 2006 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.

The authors would like to acknowledge the staff and students in the Imaging Science measurements lab for their contribution and assistance in making these measurements.

Note: imported from RIT’s Digital Media Library running on DSpace to RIT Scholar Works in February 2014.

Document Type

Article

Department, Program, or Center

Chester F. Carlson Center for Imaging Science (COS)

Campus

RIT – Main Campus

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