J. S. Perron


A study was performed to compare two methods of measuring the Optical Transfer Function (OTF), namely edge tracing and slit tracing, to evaluate the performances and limitations of each method. Edge tracing is a very common method of measuring the OTF of an optical system. It is simple to set up, but the sampling size is limited and derivation of the Edge Spread Function is required in order to obtain the Line Spread Function (LSF). This derivation induces considerable high frequency noise. A competing method, slit tracing, is more complex mainly because of physical limitations such as the actual slit width. It has the advantages of directly providing the Line Spread Function (LSF), and having constant noise over all frequencies. Both methods gave equally good results at low noise levels, but Edge tracing was found to be advantageous at higher noise levels.

Library of Congress Subject Headings

Optical transfer function--Measurement--Evaluation; Optical measurements--Evaluation; Image processing

Publication Date


Document Type


Department, Program, or Center

Chester F. Carlson Center for Imaging Science (COS)


Easton, R.

Advisor/Committee Member

Lechner, H.


Note: imported from RIT’s Digital Media Library running on DSpace to RIT Scholar Works. Physical copy available through RIT's The Wallace Library at: TA1632 .P475 1988


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